The application note presents things related to the network analyzer, conversion, measurements, cavity, analyzer, resonant frequency, dielectric material, measurement, measurement, and calculation. Inside this application note the reader can find information around parameter, the dielectric parameters, samples, probe, the reference liquids, permittivity, sample, frequency resolution, and accuracy.
Many information around sample holder, techniques, dielectric measurement, procedure, the dielectric properties, dielectric material properties, permittivity calculation, permeability, characteristics, and network analyzers are described inside this application note. The following are grabbed from the application note:
The application note describes the techniques to measure the dielectric properties of materials using a network analyzer. It also shows methods for converting the s-parameters to dielectric properties. Another application note will be written to show practical testing solutions with examples. Subject to change – CY Kuek 07.2006 – RAC0607-0019 Measurement of dielectric material properties
Also, this application note contains info regarding dielectric parameters, network analyzer, iterative technique, conversion techniques, measurement procedure, calibration techniques, iterative conversion method, parameters, and calibration.