Built-in Current Sensor for IDDQ Test

In this paper we can read information such as reservoir capacitor voltage, sensitivity, noise, flip flop decision, circuit, technology, sampling, system, current level, circuits, design, resolution level, power dissipation, resolution, input signal, capacitor voltage, and calibration. The paper presents information like output, transmission, reservoir capacitor, iddq, signal, high resolution, level, input voltage, pulldown transistors, predicted sampling, transfer curve, voltage drop, power, deviation, clock, performance, and current.

There are lots of information such as transistors, defect, noise level, supply line, test, iddq testing, digital signal, drift, measurement time, calibration circuit, voltage, data detector, bit, predicted sampling variance, stochastic sensor, sensor, and input are presented inside this paper. Below are excerpted from the paper:

A practical Built-in Current Sensor (BICS) design is described in this paper. This sensor system is able to monitor the IDDQ at a resolution level of 10 µA. This system can translate the current level into a digital signal, with scan chain readout. There is no system performance degradation for this sensor and its power dissipation is kept at a very low level. With the help of a self-calibration circuit, the sensor can maintain its accuracy and achieve a clock rate of over 1 GHz, for a measurement time of a few milliseconds.

Also, this paper presents information regarding power supply, sensor system, calibration drift, current sensor, capacitor, transmission circuit, flip flop, calibration step, rate, sampling variance, self calibration circuit, self calibration, measurement, drift rate, detector, calibration voltage, and system performance degradation.

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File size: 1.105 MB, number of pages: 10, download server: faculty.cs.tamu.edu
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